Date of Award
2017-01-01
Degree Name
Master of Science
Department
Physics
Advisor(s)
Felicia S. Manciu
Abstract
The correlations between induced stress on undoped and boron-doped diamond (BDD) thin films, sample chemical composition, and fabrication substrate are investigated in this study via confocal Raman microspectroscopic analysis. Stability of BDD films is relevant to fast-scan cyclic voltammetry, as film delamination and dislocation of BDD-coated electrodes that can occur during neurosurgical electrode implantation can negatively impact the biosensing reliability of this technique. Electrodes were fabricated by coating cylindrical tungsten rods using a custom-built chemical vapor deposition reactor. The results of the analysis reveal a direct correlation between regions of pure diamond and enhanced material stress, as well as preferential boron incorporation into the diamond lattice. Higher amounts of boron addition were shown by the Raman mapping to coincide with definite stress release throughout the entire film thickness. Additionally, sp2 type carbon impurities may contribute to high values of compressive stress beyond those predicted by the film-substrate lattice mismatch.
Language
en
Provenance
Received from ProQuest
Copyright Date
2017-05
File Size
40 pages
File Format
application/pdf
Rights Holder
Emma M.A. Sundin
Recommended Citation
Sundin, Emma M.a., "Raman Microscopic Analysis of Internal Stress in Boron-doped Diamond Thin Films" (2017). Open Access Theses & Dissertations. 561.
https://scholarworks.utep.edu/open_etd/561
Included in
Materials Science and Engineering Commons, Mechanics of Materials Commons, Optics Commons