"An atomic force microscopy investigation of film roughness and device " by Joseph Gerarde Rascon
 

An atomic force microscopy investigation of film roughness and device performance in ACTFEL display devices

Joseph Gerarde Rascon, University of Texas at El Paso

Abstract

Abstract not available

Subject Area

Electrical engineering

Recommended Citation

Rascon, Joseph Gerarde, "An atomic force microscopy investigation of film roughness and device performance in ACTFEL display devices" (1996). ETD Collection for University of Texas, El Paso. AAIEP04858.
https://scholarworks.utep.edu/dissertations/AAIEP04858

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