Date of Award


Degree Name

Master of Science


Electrical Engineering


Deidra R. Hodges


Photovoltaic devices based on perovskite materials are constantly progressing towards more applicability in large-area panels. In order for perovskite-based photovoltaics to reach reliable and stable commercialization, common issues with the use of perovskite still need to be resolved, including the need to identify fabrication processes that can yield optimal material parameters for better photovoltaic performance. Defining an optimal fabrication process requires that researchers and manufacturers alike come to an agreement regarding perovskite characteristics that result from device operation and material processing. This work focuses on characterizing physical, electrical, and electronic properties of a FAxCs1-xPb(IyBr1-y)3 perovskite, and how some of these properties may be affected by changes in a thermal annealing process that follows material deposition. This work serves to build a foundation in potentially identifying a proper annealing process that results in perovskite material that isnâ??t degraded into secondary components nor of a non-uniform grain structure. Electrical characterization is performed via Hall effect in order to observe any changes in material resistivity. Perovskite surface properties, including layer roughness and size of grains, are observed through scanning electron microscopy (SEM) and atomic force microscopy (AFM). Elemental composition / atomic ratios and deep-level electronic characterization is performed through X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS), respectively. Included in XAS characterization are X-ray absorption near-edge spectroscopy (XANES) and extended X-ray absorption fine structure (EXAFS) observations of core-level lead (Pb) and bromine (Br) atoms.




Received from ProQuest

File Size

62 pages

File Format


Rights Holder

Angel Moiseis De La Rosa